半导体激光器光束准直系统的功率耦合效率

在长距离无线光通信中，接收点光功率密度与光束发散角平方呈反比关系，为了获得小的发散角和大的功率耦合效率，要求准直系统有较大的数值孔径(NA)，但数值孔径过大会增加像差，因此合理设计功率耦合效率与准直系统的数值孔径就非常重要。该文对半导体激光器光束准直系统中功率耦合效率进行了研究，给出了半导体激光器光束功率耦合效率与k(孔径半径与孔径处等效光束半径之比)的关系表达式，并结合激光器光束准直系统，给出了半导体激光器光束功率耦合效率与准直系统数值孔径的关系表达式。该研究结论对于半导体激光器光束准直系统设计具有参考作用。     

准直孔法改善束流品质初探

本文提出了用准直孔结合调节束流导引磁场获得较好品质强流电子束的方法,运用该方法在1.5MeV直线感应加速器(LIA)进行了试验,结果准直束流前后沿明显减小,束亮度提高几倍;同时,用此方法测出了束密度及束亮度的径向分布.     

Photorefractivity of hyperbranched polyisophthalate endcapped with pendant carbazolyl and azobenzene groups

A novel hyperbranched polyisophthalate containing pendant carbazolyl and azobenzene groups at the terminals was synthesized, and its photorefractivity has also been evaluated by the effective electro-optic (EO) coefficient, two-beam couple (TBC) coefficient, diffraction efficiency and photorefractive (PR) response time. This PR polymer has a low glass transition temperature of 21 °C without any extra plasticizer added, which provides a necessary free volume for EO chromophore reorientation during the recording process at room temperature. The obtained PR film exhibited an effective EO coefficient of 30 pm V⁻¹, a TBC coefficient of 59 cm⁻¹, a diffraction efficiency of 17%, and a modulation index of 1.67 × 10⁻³ at the wavelength of 632.8 nm with an applied electric field of 80 V μm⁻¹ at room temperature. The TBC coefficient was found to be beam-intensity dependent, compared with what is found in inorganic crystals. Moreover, a fast PR response time of 10 ms was deduced at an erasing beam intensity of 1.0 W cm⁻².     

Two-beam interference detection of the changes in fibre structural parameters during low drawing process

A Pluta polarizing interference microscope with a fibre stretching device attached was used to detect the changes in molecular structure that occur during the fibre cold drawing process. Fibres drawn with low draw ratios show different types of deformation mechanisms. The interference patterns recorded at different draw ratios are used to relate the deformation mechanisms with the measured structural parameters. Some optical parameters are measured such as; refractive indices nand n birefringence n, the polarizability per unit volume , the orientation distribution function f(θ), the angle θ between the stretching direction and the chain axis, and the angle θ_m which the transition dipole moment of the molecular species makes with the molecular axis (chain axis). Three polymeric fibres (Polyethylene terephthalate PET, Polypropylene PP and Polyamide PA) were used in this study and their interferograms are illustrated.     

准直物镜对杂光测量结果的影响

论述准直物镜对杂光系数测量的影响，并给出实验例证，提出在高精度杂光测量中应扣除准直物镜杂光测量结果的影响。     

基于法国实验客体的X射线准直技术研究

通过研究法国实验客体(FTO)的闪光照相过程,设计了静态照相过程中采用的准直措施,除传统的一二级准直体外,还通过添加三级准直体来进一步控制入射到客体边缘部分的X射线,从而降低散射的影响。蒙特卡罗方法模拟结果表明,采用三级准直技术可以有效地控制散射的影响,图像接收平面各边界的直散比有了明显的提升。     

分光计快速调节辅助装置的设计与制作

针对传统JJY型分光计调节中的困难,在确保分光计原有结构和功能不变的前提下,设计、制作出可实现分光计简易调节的辅助装置,极大地提高了教学效率。     

准直磨料射流在准直管内流动机理及切割应用研究

分析了准直磨料射流的工作原理、特点及高速多相流体介质在准直管内有阻运动时的磨粒运动方程式。研究表明,准直管管长在０．４ｍ～３ｍ范围内磨粒速度基本保持不变,准直管长度、直径、供料量和磨粒型号等参数之间存在最佳配合关系。本为使用准直磨料射流进行切割和冲蚀的工程应用提供了初步的理论基础。     

Design of a laser pointer

A laser pointer has been designed using a red diode laser (670 nm). The optics of the pointer consists of a four element collimating lens, two prism compressor and a two lens reversed Galilean afocal. The beam diameter of the laser pointer is 4.2 mm.     

Fabrication of 550 nm gratings in fused silica by laser induced backside wet etching technique

A series of 550 nm spacing gratings were fabricated in fused silica by laser induced backside wet etching (LIBWE) method using the fourth harmonic of a Q-switched Nd:YAG laser (wavelength: λ = 266 nm; pulse duration: FWHM = 10 ns). During these experiments we used a traditional two-beam interference method: the spatially filtered laser beam was split into two parts, which were interfered at a certain incident angle (2θ = 28°) on the backside surface of the fused silica plate contacting with the liquid absorber (saturated solution of naphthalene-methyl-methacrylate c = 1.85 mol/dm³). We studied the dependence of the quality and the modulation depth of the prepared gratings on the applied laser fluence and the number of laser pulses. The surface of the etched gratings was characterized by atomic force microscope (AFM). The maximum modulation depth was found to be 180-200 nm. Our results proved that the LIBWE procedure is suitable for production of submicrometer sized structures in transparent materials.